Microscopy Calibration, Test & Reference Standards Overview
Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data. This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.
|
SEM - FIB - FESEM - Table top SEM
| ||
|---|---|---|
 |
 |
 |
|
MCS-1 & MCS-0.1 traceable or certified |
MTC-5 Multiple Targets for medium & low magnification calibration, traceable |
LAMC-15 traceable low magnification / |
|
 |
 |
 |
|
M-1 & M-10 traceable grid patterns |
Gold on carbon resolution test specimens |
Tin on carbon resolution test specimens |
|
SEM / EDS / WDS - TEM / EDS
| ||
|
 |
 |
 |
|
EDS / WDS compact calibration standards |
EDS / WDS reference standard for quantitative analysis |
TEM EDS calibration standard |
|
TEMThese specimens enable optimising and testing of TEM performance. The unique multifunctional MAG*I*CAL magnification calibration standard is directly traceable to a fundamental constant of nature. All provided in the standard 3mm TEM grid format | ||
|
|
|
|
| MAG*I*CAL traceable TEM calibration standard |
Oriented gold crystal calibration sample |
TEM resolution standards / Evaporated Aluminium calibration sample |
 |
 |
|
| Perforated carbon film test sample | TEM test standards / Evaporated Platinum/Iridium test sample |
Combined test specimen |
 |
 |
|
|
Fine gold particle resolution sample |
Graphitised carbon black resolution sample |
Copper foil on Aluminium grid |
|
AFM-SPM
| ||
 |
 |
|
|
AFM TipCheck sample |
AFM XYZ Standards |
|
|
LM - Digital Imaging
| ||
 |
 |
 |
|
Glass stage micrometers and graticules; Linear, |
Micro-Tec Silicon based graticules; linear, cross and compound, traceable |
Micro-Tec MTC-5 multiple targets |
