Microscopy Calibration, Test & Reference Standards Overview
Calibration standards are indispensable tools for calibrating microscopes and X-ray analysis systems. Only calibrated instruments produce precise data. This overview shows the available calibration standards for SEM, FIB-SEM, TEM, EDS/WDS, LM and digital imaging systems. These versatile, precise yet affordable calibration standards enable optimum calibration of your microscope.
SEM - FIB - FESEM - Table top SEM
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MCS-1 & MCS-0.1 traceable or certified |
MTC-5 Multiple Targets for medium & low magnification calibration, traceable |
LAMC-15 traceable low magnification / |
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M-1 & M-10 traceable grid patterns |
Gold on carbon resolution test specimens |
Tin on carbon resolution test specimens |
SEM / EDS / WDS - TEM / EDS
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EDS / WDS compact calibration standards |
EDS / WDS reference standard for quantitative analysis |
TEM EDS calibration standard |
TEMThese specimens enable optimising and testing of TEM performance. The unique multifunctional MAG*I*CAL magnification calibration standard is directly traceable to a fundamental constant of nature. All provided in the standard 3mm TEM grid format | ||
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MAG*I*CAL traceable TEM calibration standard |
Oriented gold crystal calibration sample |
TEM resolution standards / Evaporated Aluminium calibration sample |
Perforated carbon film test sample | TEM test standards / Evaporated Platinum/Iridium test sample |
Combined test specimen |
Fine gold particle resolution sample |
Graphitised carbon black resolution sample |
Copper foil on Aluminium grid |
AFM-SPM
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AFM TipCheck sample |
AFM XYZ Standards |
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LM - Digital Imaging
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Glass stage micrometers and graticules; Linear, |
Micro-Tec Silicon based graticules; linear, cross and compound, traceable |
Micro-Tec MTC-5 multiple targets |