Introduction

The low profile pin mounts have been especially developed for FIB/SEM applications to bring samples closely to the pole piece of the FIB/SEM systems to enable low working distances. They are available as flat, vertical and complementary tilt versions of the standard Ø12.7mm pin stub. The complimentary tilt version allow positioning of the sample surface flat under the FIB column without the need to tilt the stage. The tilt angle is relative to the vertical electron beam column of the FIB/SEM systems. ----> Made from vacuum grade aluminium and fully compatible with the standard pin stubs for storage and handling.

Examples