LN2 Cooling -170℃ + X Tilt±60°
Get the High Resolution image and EDS Analysis at-170℃
Temp. Control ±0.005℃
EDS Tomography and EELS data
3D silica distribution image by STEM-EDX tomography with IR/SBR blend
Polymer blend, compatibilization, interface, STEM EDX , EELS and ELNES
Provision data : AIST of Dr. Shin Horiuvhi : ACS Appl. Polym. Mater. 2019, 1, 815−824
Reasons for high-resolution image at -170℃
We realized it with the following our special system.
- Mechanical drift cancellation mechanism from our patented technology
- High-precision temperature controller . Range is ± 0.005 ° C .
- Original gonio cover for cooling tem holder
By making these into one system, it is possible to obtain much easyer get the high resolution image than current Cryo TEM holder.
