EM-Tec FIB grid holders and FIB grid + sample holders

Order EM-Tec FIB grid sample holders (pin)   |   Order EM-Tec FIB grid sample holders (M4)

a few examples

Introduction 

The EM-Tec FIB grid holders are designed to hold FIB grids and provide easy access to the posts on the FIB grids to attach the milled FIB lift-out lamellae. The FIB grid holders can be used in the FIB/SEM systems but also for safe storage of the FIB grids with attached lamellae. The EM-Tec FIB grid and sample holders are compact holders which hold the FIB grids directly aside a standard  SEM pin stub with a sample. The lift-out lamellas only need to be moved over a short distance to attach them to the  FIB grids. The EM-Tec FIB grid holders are all  precision machined from vacuum grade aluminium:

• EM-Tec F12 is a basic yet practical FIB grid holder for 2 FIB grids. Based on the standard Ø12.7mm pin stub, it is compact and useful for storing valuable samples. The 10mm wide vise clamp includes a ledge for easy positioning of the FIB grids. Pin stub type only.
• EM-Tec F25 is a larger FIB grid holder which can accommodate up to 5 FIB grids of the same thickness. The 25mm wide vise include a ledge for easy positioning of the FIB grids and two brass thumb screws to operate the vise. Available with pin stub and M4 threaded hole.
• EM-Tec FS21 combines the EM-Tec F12 FIB grid holder with two standard 12.7mm (1/2”) pin stubs. The F12 FIB grid holder and the sample stubs can be rotated in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS21 FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples. Available with pin stub and M4 threaded hole.
• EM-Tec FS22 combines two F12 FIB grid holders with two standard 12.7mm (1/1”) pin stubs within a 27x27mm footprint. Both the F12 FIB grid holders and the pin stubs can be rotated independently in the holder for selecting the optimum orientation in the FIB/SEM system. The EM-Tec FS22 dual FIB grid and sample holder enables loading the samples and FIB grids close together. The FIB grid and the sample stubs are at the same level when using Si wafer samples. Available with pin stub and M4 threaded hole.
• EM-Tec FS25 combines the wider FIB grid holder vise with a holder for samples on the Ø25.4mm pin stubs in a single compact holder. This provides a single loading cycle for FIB grids and samples and short distances from lift-out to lamellae mounting. Wafer type sample surface is at the same height as the FIB grid posts. Available with pin stub and M4 threaded hole.

These holders can all be used on th FIB and FIB/SEM systems from FEI, Zeiss and Tescan. For the EM-Tec F25 and FS25 is an M4 version available for Hitachi SEMs. For JEOL FIB/SEM system use a suitable EM-Tec stub adapter.

Capacity, size and compatibility of EM-Tec FIB grid holders and FIB grid sample holders:

Ordering Information for EM-Tec FIB grid and FIB grid sample holders for FIB/SEM systems using pin stubs; FEI Dualbeam systems, Zeiss Cross Beam systems and Tescan FIB/SEM systems