EM-Tec SEM sample holders overview
The EM-Tec range of SEM sample holders comprises a wide variety of holders to make it easier and quicker to mount your samples directly in the SEM. Samples are held by clamping between jaws or secured with screws. When samples are secured correctly, the sample won't move which increases spatial resolution both for imaging and analysis. With the EM-Tec SEM sample holders there are no out-gassing or contamination issues. All EM-Tec SEM sample holders with a M4 threaded hole are fully compatible with the EM-Tec SEM stage adapters.
The wide choice of EM-Tec SEM sample holders include:
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| Small stub based sample holders – Pin stub based – JEOL stub based – Hitachi stub based |
EM- Tec versatile vise clamp sample holders |
SampleClip holders: – Standard pin stub – Zeiss pin stub – JEOL stubs – Hitachi stubs |
Pre-tilt sample holders – Fixed tilt angle – Variable tilt angles
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| Centering vice sample holder | EBSD sample holders | Swivel sample holders | Compact spring loaded vise holder |
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| Compact vise holder | 90 degree and off-set sample holder | Universal Spring-loaded vice sample holders |
Geological slide holders |
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| Gold series sample holders | Reference sample holders | TEM grid holders | STEM imaging holder |
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| FIB grid sample holders | Bulk sample holders | Multi pin stub holders | Metallographic mount holders |
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| JEOL multi stub holders | Hitachi multi stub holders | JEOL Neoscope holders | Hitachi TM series holders |
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