EM-Tec SEM stub based compact sample holders

Order pin stub based (info)   |   Order JEOL cylinder stub based (info)   |   Order Hitachi M4 stub based (info)

Introduction   

The EM-Tec stub based SEM sample holders are all small SEM sample holders based on (modified) SEM sample stubs. They have the same footprint as the original SEM sample stubs and are directly compatible with the SEM stage or SEM sample stub holder.  These affordable sample holders increase efficiency and reduce sample preparation time. Using sample holders reduces the use of conductive adhesives which can be a source of contamination.

The EM-Tec stub based small sample holders formats are:

• Standard pin stub based compact sample holders
• JEOL cylinder stub based sample holders
• Hitachi M4 stub based sample holders

The pin stub based sample holders comprise the largest selection; they can be easily used on other SEM platforms by using the cost efficient EM-Tec SEM stub adapters. All EM-Tec compact SEM stub based SEM sample holders are precision machined from vacuum grade aluminium unless otherwise noted. Provided with set screws and allen keys.

EM-Tec pin stub based compact sample holders

There is a wide choice of the compact EM-Tec pin stub based sample holders. Since they are small and using the standard pin stub format, they will fit in virtually any SEM compatible with standard pin stubs. They are based on standard pin stubs or made from modified pin stubs. Ideal for table top SEMs such as the Phenom but just as useful on laboratory grade SEMs and FESEMs. Using a sample holders is quicker, cleaner and provides more stability than conductive tapes or glues.

The EM-Tec based compact pin stub holders line up include:

• EM-Tec PS2 mini pin stub tube/needle clamp. Capacity is up to Ø2mm diameter, the needle is secured with a small set screw. This holder is ideal for probes, needles, wire and thin tubes. Perfect holder for the Cameca Atom Probe Microscope needle shaped samples.  Holder size is Ø6x4mm. Made from brass and plated with 1µm of pure gold.
• EM-Tec PS3 mini pin stub SampleClamp to clamp thin samples, foils, Si wafer pieces etc. directly on the small stub. Samples are held down by a washer under the small screw. More effective and cleaner than using tape or conductive paint/paste. Pin stub diameter is 12.7mm.
• EM-Tec PS4 mini pin stub vise clamp for sample thickness from 0-4mm. The sample is held vertically with a small set screw.  Most effective way to study cross section of thin samples. Holder size w/o pin is Ø12.7x7.2mm.
• EM-Tec PS6 mini pin stub split vise clamp for sample thickness from 0-6mm. The sample is clamped between the two min vise clamps. The split vise jaws are closed by an allen screw. Closed split vise diameter is 12.7mm; when opened it is 19x12.7mm.
• EM-Tec PS7 mini pin stub dual slot vise with two slots of one mm wide. Ideal for holding thin wafer pieces samples for cross section imaging. Samples are clamped by set screws. Holder size w/o pin is Ø15x6mm.
• EM-Tec PS12 pin stub vise clamp for sample thickness from 0-12mm. The sample is held vertically with a set screw.  Most effective way to study cross section of thin samples. Holder size w/o pin is Ø25x6mm.
• EM-Tec PS5 mini pin stub to clamp round shaped samples up to Ø3.5mm in diameter. Samples are held by a set screw.  Pin stub top diameter is 12.7mm.
• EM-Tec PS8 mini pin stub to clamp round shaped samples up to Ø6.0mm in diameter. Samples are held by a set screw.  Pin stub top diameter is 12.7mm.
• EM-Tec PS16 pin stub to clamp round shaped samples up to Ø16.0mm in diameter. Samples are held by a set screw.  Pin stub top diameter is 25mm.
• EM-Tec PS11 mini pin stub holder for a single TEM or FIB grid. TEM grid rim rests on a ledge; in the middle of the cavity there is dimple; samples on the grid are free standing and not touched by the holder. Groove is provided for easy loading/unloading of the TEM grid with fine tweezers. The TEM grid is not clamped. This holder is used for quickly checking a TEM grid in the SEM or as a grid holder for a carbon evaporator. Pin stub top diameter is 12.7mm
• EM-Tec PS14 mini pin stub holder for four TEM or FIB grids. TEM grid rim rests on a ledge; in the middle of each cavity there is dimple to provide a non-touching area for the mesh of the grid. Grooves are provided for easy loading/unloading of the TEM grids with fine tweezers. The TEM grids are not clamped. This holder is used for quickly checking TEM grids in the SEM or as a grid holder for a carbon evaporator. Pin stub top diameter is 12.7mm.
• EM-Tec PS15 swivel pin stub mount. The head of the mount is attached to the pin via a swivel hinge which allows for 90 degrees tilting each way. Excellent mount for SEMs without tilting facilities or when random tilt angled are needed. When the desired tilt angle is set, the top is secured with a socket cap screw. Top diameter is 15mm and height above pin is 15mm.
• EM-Tec PE10 Pin stub extender with an extra height of 10mm. Use when extra height is needed to bring the sample closer to the pole piece of the SEM, without using the Z-axis from the SEM stage. Size w.o. pin is Ø12.7x13.2mm.
• EM-Tec F12 is a basic yet practical FIB grid holder for 2 FIB grids. Based on the standard Ø12.7mm pin stub it is compact and useful for storing valuable samples. The 10mm wide vise clamp includes a ledge for easy positioning of the FIB grids.
• EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam  FIB systems. Size w.o. pin is Ø12.7x17mm.
• EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for FEI Dual Beam FIB systems. Size w.o. pin is Ø12.7x17mm.
• EM-Tec P45 fixed 45° tilt holder for standard and Zeiss pin stubs. Image sample surfaces or cross sections directly under 45° w/o having to use the tilt on the SEM stage. Particularly useful for table top SEMs without tilt facilities or to extend tilt angles for limited tilt stages. Size w.o. pin is Ø12.7x17mm.
• EM-Tec P45M fixed 45° tilt holder Hitachi M4 cylinder stubs. Image sample surfaces or cross sections directly under 45° w/o having to tilt the SEM stage. Particularly useful for table top SEMs without tilt facilities or to extend tilt angles for limited tilt stages. Size w.o. pin is Ø12.7x17mm.
• EM-Tec P70  fixed 70° EBSD tilt holder for pin stubs and pin stub type sample holders. Tilts the sample surface directly at the correct angle (70°) for EBSD analysis applications. Suitable for surfaces and cross sections. Size w.o. pin is Ø12.7x20mm.
• EM-Tec P70M fixed 70° EBSD tilt holder for Hitachi M4 stubs and sample holders with M4 threaded hole. Tilts the sample surface directly at the correct angle (70°) for EBSD analysis applications. Size w.o. pin is Ø12.7x20mm.

EM-Tec cylinder stub based compact sample holders for JEOL SEMs

The compact EM-Tec cylinder stub based sample holders for JEOL SEMs are made from either the Ø12.2x10 or Ø25x10mm JEOL cylinder stubs. They are directly compatible with the JEOL stub holders on the SEM stage. Perfect for the JEOL Neoscope 5000/6000 table top SEMs, but equally useful on laboratory grade SEMs and FESEMs.

Currently available JEOL cylinder stub based EM-Tec holders are:

• EM-Tec JS2 mini cylinder stub tube/needle clamp. Capacity is Ø2mm maximum, the needle is secured with a small set screw. This holder is ideal for probes, needles, wire and thin tubes. Perfect holder for the Cameca Atom Probe Microscope needle shaped samples.  Holder stub size is Ø12.2x10mm.
• EM-Tec JS3 mini cylinder stub SampleClamp to clamp thin samples, foils, Si wafer pieces etc. directly on the small stub. Samples are held down by a washer under the small screw. More effective and cleaner than using tape or conductive paint/paste. Holder stub size is Ø12.2x10mm.
• EM-Tec  JS4 mini cylinder stub vise clamp for sample thickness from 0-4mm. The sample is held vertically with a small set screw.  Most effective way to study cross section of thin samples. Holder stub size is Ø12.2x10mm.
• EM-Tec JS12 cylinder stub vise clamp for sample thickness from 0-12mm. The sample is held vertically with a set screw (multiple lengths are supplied). Cost effective and practical small vise clamp based on the stub size of Ø25x10mm.
• EM-Tec JS16 cylinder stub to clamp round shaped samples up to Ø16mm in diameter. Samples are held by a set screw in the middle of a 25mm JEOL stub.  Holder stub size is Ø25x10mm.

Capacity, stub size and sample holding methode of the EM-Tec JEOL stub based compact sample holders 

EM-Tec M4 stub based compact sample holders for Hitachi SEMs

The compact EM-Tec cylinder stub based for Hitachi SEMs are based on either the Ø15mm or the Ø25mm Hitachi M4 sample stubs. They can be used directly on the Hitachi SEM stage adapters and the EM-Tec SEM stage adapters with M4 thread. They are perfect for the Hitachi TM1000, TM3000, TM3030 table top SEMs, but will be very useful on all other Hitachi SEMs as well.

Currently available Hitachi M4 stub based EM-Tec holders are:

• EM-Tec HS2 mini M4 cylinder tub/needle clamp. Capacity is Ø2mm maximum, the needle is secured with a small set screw. This holder is ideal for probes, needles, wire and thin tubes. The perfect holder for the Cameca  Atom Probe Microscope needle shaped samples.  Holder size is Ø15x10mmxM4.
• EM-Tec HS3 mini M4 cylinder stub SampleClamp to clamp thin samples, foils, Si wafer pieces etc. directly on the stub. Samples are held down by a washer under the small screw. More effective and cleaner than using tape or conductive paint/paste. Holder stub size is Ø15x10mmxM4.
• EM-Tec HS6 mini M4 cylinder stub vise clamp for sample thickness from 0-6mm. The sample is held vertically with a small set screw.  Simple and cost-effective way to clamp cross section of thin samples. Holder stub size is Ø15x10mm xM4.
• EM-Tec HS15 M4 cylinder stub vise clamp for sample thickness from 0-16mm. The sample is held vertically with a set screw (multiple lengths are supplied). Cost effective and practical small vise clamp base on the stub size of Ø25x10mm xM4.
• Em-Tec HS10 mini M4 cylinder stub to clamp round shaped samples up to Ø10mm in diameter. Samples are held by a set screw; samples are clamped slightly off-center to get maxium size in this small holder. Holder stub size is Ø15x10mm xM4.
• EM-Tec HS16 M4 cylinder stub to clamp round shaped samples up to Ø16mm in diameter. Samples are held by a set screw in the middle of a 25mm Hitachi stub.  Holder stub size is Ø25x10mmxM4.
• EM-Tec HS7 mini pin stub dual slot vise with two slots of one mm wide. Ideal for holding thin wafer like samples for cross section imaging. Sample are clamped by set screws. Holder size w/o pin is Ø15x6mm.
• EM-Tec H3 multi stub adapter for 3 x Ø15mm Hitachi stubs. Compact and simple multi stub adapter based on the Hitachi Ø25x6mmxM4 stub.
• EM-Tec HE10 Hitachi M4 stub extender with a fixed height of 10mm. Use when extra height is needed to get closer to the pole piece of the SEM without using the Z-axis of the SEM stage. Overall size is Ø15x10mm xM4.
• EM-Tec H45P fixed 45° tilt holder for standard and Zeiss pin stubs. Image sample surfaces or cross sections directly under 45° w/o having to use the tilt on the SEM stage. Particularly useful for table top SEMs without tilt facilities or to extend tilt angles for limited tilt stages. Overall size is Ø12.7x17mm xM4.
• EM-Tec H45 fixed 45° tilt holder Hitachi M4 cylinder stubs. Image sample surfaces or cross sections directly under 45° w/o having to tilt the SEM stage. Particularly useful for table top SEMs without tilt facilities or to extend tilt angles for limited tilt stages. Overall size is Ø12.7x17mm xM4.
• EM-Tec H70P  fixed 70° EBSD tilt holder for pin stubs and pin stub type sample holders. Tilts the sample surface directly at the correct angle (70°) for EBSD analysis applications. Suitable for surfaces and cross sections. Overall size is Ø12.7x20mm xM4.
• EM-Tec H70 fixed 70° EBSD tilt holder for Hitachi M4 stubs and sample holders with M4 threaded hole. Tilts the sample surface directly at the correct angle (70°) for EBSD analysis applications. Overall size is Ø12.7x20mm xM4.

Capacity, stub size and sample holding methode of the EM-Tec Hitachi M4 stub based compact sample holders

Ordering Information for EM-Tec pin stub based compact sample holders for SEMs using pin stubs; FEI, Philips, Zeiss, LEO, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, ETEC and Novascan SEMs.