CSX Calibration Standards
EM-Tec CXS calibration and RXS reference standards for EDS, WDS and BSD
compact & practical analytical standards
Order EM-Tec CXS calibration and reference standards for EDS, WDS and BSD
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Introduction The EM-Tec CXS calibration and reference standards are designed for calibration, resolution testing and performance testing. Each standard contains a selection of reference materials, in the form of element or compounds, optimized for specific calibration tasks. They are available with two types of practical and compact holders: - Compact Ø12.7mm standard aluminium pin stub with up to 10 elements/compounds. The pin stub holder is compatible with FEI, Philips, Zeiss, Leo, Tescan, Phenom, Aspex, Leica, Cambridge instrument and CamScan SEMs |
Example EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub |
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The elements/compounds are all mounted with highly conductive and vacuum compatible silver filled epoxy. The mounts are then polished to ensure that all the elements/compounds are in the same plane. Virtually all standards include a Faraday cup to enable electron probe measurements and monitoring. The calibration standards with non-conductive elements/compounds are carbon coated to ensure conductivity and avoid charging.
For using the calibration standards on JEOL and Hitachi SEM, please consult the page with the EM-Tec SEM stub adapters.
The Em-Tec calibration and reference standards are intended for calibration and testing of:
- SEM / EDS systems and/or SEM / WDS systems
- SEM back scattered electron detector (BSD)
- SEM cathode-luminescence (CL) detector
- SEM / Raman system
-SEM / micro-XRF systems
- micro-XRF systems
Overview and specifications of the various EM-Tec CXS calibration and reference standards
|
Product # |
Type |
Calibration application description |
Standards # |
Far. cup |
Size |
|
AU-36-000505 |
CXS-5F |
Light elements, EDS detector |
5 |
Yes |
12.7mm x pin |
|
AU-36-000506 |
CXS-5C |
Light elements, EDS detector, Image |
5 |
No |
12.7mm x pin |
|
AU-36-000507 |
CXS-5BE |
BSD, EDS detector |
5 |
Yes |
12.7mm x pin |
|
AU-36-000522 |
CXS-6BE |
BSD, EDS detector |
6 |
Yes |
12.7mm x pin |
|
AU-36-000510 |
CXS-10BE |
BSD, EDS detector |
10 |
Yes |
12.7mm x pin |
|
AU-36-000508 |
CXS-5N |
Light elements, EDS detector |
5 |
Yes |
12.7mm x pin |
|
AU-36-000512 |
CXS-5LE |
Light elements detection performance |
5 |
Yes |
12.7mm x pin |
|
AU-36-000513 |
CXS-5TX |
EDAX TEX set-up |
5 |
Yes |
12.7mm x pin |
|
AU-36-000514 |
CXS-5LX |
EDAX LEX / TEX set-up |
5 |
Yes |
12.7mm x pin |
|
AU-36-000517 |
CXS-6F |
EDS detector & performance |
6 |
Yes |
12.7mm x pin |
|
AU-36-000521 |
CXS-6LE |
Light elements, EDS detector |
6 |
Yes |
12.7mm x pin |
|
AU-36-000618 |
RXS-18RE |
Rare earth metals reference |
18 |
Yes |
25.4x9mm |
|
AU-36-000621 |
RXS-21RE |
Rare earth metals reference |
21 |
Yes |
25.4x9mm |
|
AU-36-000636 |
RXS-36M |
Metals reference |
36 |
Yes |
25.4x9mm |
|
AU-36-000640 |
RXS-40MC |
Mineral & compounds reference |
40 |
Yes |
25.4x9mm |
|
AU-36-000707 |
RXS-6CL |
Cathode-luminescence reference |
7 |
Yes |
12.7mm x pin |
|
AU-36-000710 |
RXS-10PD |
Peak deconvolution, resolution test |
10 |
Yes |
12.7mm x pin |
|
AU-36-000711 |
RXS-10RA |
Raman performance |
10 |
Yes |
12.7mm x pin |
|
AU-36-000712 |
RXC-2WSi |
Fusion, BSD/X-ray contrast & resolution |
2 |
No |
12.7mm x pin |
|
AU-36-000714 |
RXC-2TaSi |
Fusion, BSD/X-ray contrast & resolution |
2 |
No |
12.7mm x pin |
EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub
SKU: AU-36-000505-1
Original price
$480.42
-
Original price
$480.42
Original price
$480.42
$480.42
-
$480.42
Current price
$480.42