Zeiss SEM short pin stubs
Zeiss SEM short pin stubs
Flat Pin Stubs | Angled Pin Stubs | Low Profile Pin Stubs | Extra Height Pin Stubs | Engraved Pin Stubs
Introduction
The SEM pin stubs for the Zeiss and LEO SEMs, CrossBeams or SEM/FIB systems use a 6mm short pin. The pin diameter for all these pin stubs is 3.2mm (1/8'') diameter. Made from high quality, vacuum grade aluminium in different styles and sizes. The SEM pin stubs are manufactured according to original specifications for the pin stubs and enhanced for a variety of applications. The most common diameters are pin stubs with 12.7 and 25.4mm top diameter. Most flat SEM pin stubs have a 3.2mm platform height and a groove for holding and handling.
Overview
Ø6.4 mm Zeiss pin stubs
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Ø9.5 Zeiss mm pin stubs
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Ø12.7 mm Zeiss pin stubs
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Ø19 mm Zeiss pin stubs
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Ø25.4 mm Zeiss pin stubs
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Ø32 mm Zeiss pin stubs
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Ø38 mm Zeiss pin stubs
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Ø50 mm Zeiss pin stubs
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Ø63 mm Zeiss pin stubs
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Ø100 mm Zeiss pin stubs
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Standard 45° Ø12.7 mm Zeiss pin stubs
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Standard 45°/90° Ø12.7 mm Zeiss pin stubs
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Standard 45° Ø25.4 mm Zeiss pin stubs
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Standard 45°/90° Ø25.4 mm Zeiss pin stubs
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2 x 45°/90° Ø25.4 mm Zeiss pin stubs
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Double 90° Ø25.4 mm Zeiss pin stubs
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Double 90° Ø32 mm Zeiss pin stubs
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45°/90° Ø32mm Zeiss pin stubs
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Low profile Ø12.7 mm Zeiss pin stubs
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Low profile 90° Ø12.7 mm Zeiss pin stubs
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Low profile 36° Zeiss Ø12.7 mm pin stubs
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Ø12.7 mm +6 mm Zeiss pin stubs
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Engraved Ø12.7 mm pin stubs
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Engraved Ø19 mm pin stubs
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The following standard flat SEM pin stubs are available:
- Flat Zeiss pin stubs
- 6.4, 9.5, 12.7, 19, 25.4, 32, 38, 50 , 63 and 100mm stub diameter
- Angled Zeiss pin stubs to quickly image a sample under 45° or 90° w/o tilting the sample stage:
- 12.7mm stub diameter with 45° and 45/90°
- 25mm diameter with 45°, 45/90°, double 45/90° and double 90°
- Flat Zeiss pin stubs Ø12.7mm with 6mm extra height. Useful for marking, shorter working distance or to make your own custom stubs.
- Low profile Ø12.7 pin stubs to enable very short working distances for high resolution SEM imaging and FIB operations
- Engraved pin stubs with engraved patterns and numbering for mounting multiple samples or for relocating a sample. Stub diameters are 12.7, 19, 25.4 and 32mm
If you need a Zeiss SEM pin stub which is not offered in the list below, please contact us. We can manufacture custom sample stubs or suggest a solution with alternative sample stubs.