FIB pre-tilt holders

EM-Tec FIB pre-tilt stub holders

Introduction

Pre-tilt stub holders are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stub holders are used, there is no need to tilt the sample stage. Three types are available:

EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for FEI Dual Beam FIB systems. Size w.o. pin is Ø12.7x17mm.

EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam FIB systems. Size w.o. pin is Ø12.7x17mm.

EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt samples 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.

Example

EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems, Ø12.7x17mm, pin

Specifications of the EM-Tec pre-til stub holders

Product #	Style	Angle	FIB/SEM	Capacity	Size w/o pin	Stub holding method
AU-10-002238	P38	38°	FEI	Ø3.2mm pin	Ø12.7x17mm	Set screw
AU-10-002236	P36	36°	Zeiss	Ø3.2mm pin	Ø12.7x17mm	Set screw
AU-10-002235	P35	35°	Tescan	Ø3.2mm pin	Ø12.7x17mm	Set screw