RSX Reference Standards

EM-Tec CXS calibration and RXS reference standards for EDS, WDS and BSD
compact & practical analytical standards

Order EM-Tec CXS calibration and reference standards for EDS, WDS and BSD

Introduction

The EM-Tec CXS calibration and reference standards are designed for calibration, resolution testing and performance testing. Each standard contains a selection of reference materials, in the form of element or compounds, optimized for specific calibration tasks. They are available with two types of practical and compact holders:

- Compact Ø12.7mm standard aluminium pin stub with up to 10 elements/compounds. The pin stub holder is compatible with FEI, Philips, Zeiss, Leo, Tescan, Phenom, Aspex, Leica, Cambridge instrument and CamScan SEMs
- Ø25.4 x 9mm stainless steel 303 block for larger numbers of element/compounds. Compatible with the EM-Tec M26 metallographic mount holders and the EM-Tec reference holders.

Example

EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub

The elements/compounds are all mounted with highly conductive and vacuum compatible silver filled epoxy. The mounts are then polished to ensure that all the elements/compounds are in the same plane. Virtually all standards include a Faraday cup to enable electron probe measurements and monitoring. The calibration standards with non-conductive elements/compounds are carbon coated to ensure conductivity and avoid charging.

For using the calibration standards on JEOL and Hitachi SEM, please consult the page with the EM-Tec SEM stub adapters.

The Em-Tec calibration and reference standards are intended for calibration and testing of:

- SEM / EDS systems and/or SEM / WDS systems
- SEM back scattered electron detector (BSD)
- SEM cathode-luminescence (CL) detector
- SEM / Raman system
-SEM / micro-XRF systems
- micro-XRF systems

Overview and specifications of the various EM-Tec CXS calibration and reference standards

Product #	Type	Calibration application description	Standards #	Far. cup	Size
AU-36-000505	CXS-5F	Light elements, EDS detector	5	Yes	12.7mm x pin
AU-36-000506	CXS-5C	Light elements, EDS detector, Image	5	No	12.7mm x pin
AU-36-000507	CXS-5BE	BSD, EDS detector	5	Yes	12.7mm x pin
AU-36-000522	CXS-6BE	BSD, EDS detector	6	Yes	12.7mm x pin
AU-36-000510	CXS-10BE	BSD, EDS detector	10	Yes	12.7mm x pin
AU-36-000508	CXS-5N	Light elements, EDS detector	5	Yes	12.7mm x pin
AU-36-000512	CXS-5LE	Light elements detection performance	5	Yes	12.7mm x pin
AU-36-000513	CXS-5TX	EDAX TEX set-up	5	Yes	12.7mm x pin
AU-36-000514	CXS-5LX	EDAX LEX / TEX set-up	5	Yes	12.7mm x pin
AU-36-000517	CXS-6F	EDS detector & performance	6	Yes	12.7mm x pin
AU-36-000521	CXS-6LE	Light elements, EDS detector	6	Yes	12.7mm x pin
AU-36-000618	RXS-18RE	Rare earth metals reference	18	Yes	25.4x9mm
AU-36-000621	RXS-21RE	Rare earth metals reference	21	Yes	25.4x9mm
AU-36-000636	RXS-36M	Metals reference	36	Yes	25.4x9mm
AU-36-000640	RXS-40MC	Mineral & compounds reference	40	Yes	25.4x9mm
AU-36-000707	RXS-6CL	Cathode-luminescence reference	7	Yes	12.7mm x pin
AU-36-000710	RXS-10PD	Peak deconvolution, resolution test	10	Yes	12.7mm x pin
AU-36-000711	RXS-10RA	Raman performance	10	Yes	12.7mm x pin
AU-36-000712	RXC-2WSi	Fusion, BSD/X-ray contrast & resolution	2	No	12.7mm x pin
AU-36-000714	RXC-2TaSi	Fusion, BSD/X-ray contrast & resolution	2	No	12.7mm x pin

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EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si plus F/C on pin stub

SKU: AU-36-000800-1

$212.99 - $212.99

$212.99

$212.99 - $212.99

$212.99

RSX Reference Standards

EM-Tec CXS calibration and RXS reference standards for EDS, WDS and BSDcompact & practical analytical standards

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EM-Tec CXS calibration and RXS reference standards for EDS, WDS and BSD
compact & practical analytical standards