FIB low profile stubs

EM-Tec low profile pin stubs for FIB applications

Pin stubs for FEI and/or TescanFIB/SEM systems | Pin stubs for Zeiss FIB/SEM systems

Introduction
The low profile pin mounts have been especially developed for FIB/SEM applications to bring samples closely to the pole piece of the FIB/SEM systems to enable low working distances. They are available as flat, vertical and complementary tilt versions of the standard Ø12.7mm pin stub. The complimentary tilt version allow positioning of the sample surface flat under the FIB column without the need to tilt the stage. The tilt angle is relative to the vertical electron beam column of the FIB/SEM systems. ----> Made from vacuum grade aluminium and fully compatible with the standard pin stubs for storage and handling.

Examples

Available as the following types:

- low profile flat horizontal pin mount with standard or short pin
- low profile 90° vertical pin mount with standard or short pin
- 38° complimentary angle pin mount for FEI DualBeam and FIB/SEM systems
- 36° complimentary angle pin mount for Zeiss CrossBeam and FIB/SEM systems
- 35° complimentary angle pin mount for Tescan Lyra and VELA FIBxSEM systems

Specifications of the low profile pin stubs

Product #	Angle	FIB/SEM	Diameter	Standard Pin	Short Pin	Grooved side
AU-10-002112	0°	FEI, Tescan	Ø12.7mm	V	-	-
AU-10-002114	90°	FEI, Tescan	Ø12.7mm	V	-	V
AU-10-002115	35°	Tescan	Ø12.7mm	V	-	V
AU-10-002118	38°	FEI, Tescan	Ø12.7mm	V	-	V
AU-10-003112	0°	Zeiss	Ø12.7mm	-	V	-
AU-10-003114	90°	Zeiss	Ø12.7mm	-	V	V
AU-10-003116	36°	Zeiss	Ø12.7mm	-	V	V