FEI Philips SEM Pin Stubs

used on FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan

Flat | Angled | Low Profile | Extra Height | Engraved | Dish type | Cambridge S4 | Extender Stub

Introduction

Comprehensive choice of standard pin stubs to support virtually all applications. Compatible with  FEI, Philips, Tescan, Phenom, Aspex, RJLee,  AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. Made from vacuum grade aluminium with dimensions according to the original manufacturer's specifications. The smaller stubs are grooved for easy and clean handling. The most used pin stubs are the Ø12.7 mm and the Ø25.4 mm pin stubs. Pins are all 3.2mm diameter with a length of 9.5mm. The Ø12.7 mm pin stubs is also available in brass.

Overview

Ø6.4 mm pin stubs	Ø9.5 mm pin stubs	Ø12.7 mm pin stubs	Ø12.7 mm pin stubs + flat
Ø19 mm pin stubs	Ø25.4 mm pin stubs	Ø32 mm pin stubs	Ø38 mm pin stubs
Ø50 mm pin stubs	Ø63 mm pin stubs	Ø100 mm pin stubs	Ø12.7 mm swivel pin stubs
High profile 45° Ø12.7 mm pin stubs	High profile 45°/90° Ø12.7 mm pin stubs	Standard 30° Ø12.7 mm pin stubs	Standard 45° Ø12.7 mm pin stubs
Standard 45°/90° Ø12.7 mm pin stubs	70° EBSD Ø12.7 mm pin stubs	Standard 45° Ø25.4 mm pin stubs	Standard 45°/90° Ø25.4 mm pin stubs
2 x 45°/90° Ø25.4 mm pin stubs	Double 90° Ø25.4 mm pin stubs	Double 90° Ø32 mm pin stubs	45°/90° Ø32mm pin stubs
10mm pin stub extender	Ø12.7 mm+ 4 mm pin stubs	Ø12.7 mm +6 mm pin stubs	Ø25.4 mm +4 mm pin stubs
Low profile Ø12.7 mm pin stubs	Low profile 90° Ø12.7 mm pin stubs	Low profile 35° Tescan Ø12.7 mm pin stubs	Low profile 38° FEI Ø12.7 mm pin stubs
Engraved Ø12.7 mm pin stubs	Engraved Ø19 mm pin stubs	Dish type Ø12.7 mm pin stubs	Brass Ø12.7 mm pin stubs
Copper Ø12.7 mm pin stubs	Cambridge S4 type Ø32 mm stubs

 The full range of standard SEM pin stubs include:

• Flat SEM pin stubs
• 6.4, 9.5, 12.7, 19, 25.4, 32, 38, 50, 63 and 100mm stub diameter
• Special 12.7mm stub diameter with a flate side and 12.7mm stub in brass

• Angled pin stubs to quickly image or analyse a sample under 30°, 45°, 70° or 90° w/o tilting the sample stage: 12.7mm stub diameter with 30°, 45°, 45/90° and 70° pre-tilt in various heights
  • 25mm diameter with 45°, 45/90°,  double 45/90° and double 90°
  • 32mm diameter with 45°and double 90° 

• Flat Pin stubs with extra height. Useful for marking, shorter working distance or to make your own custom stubs. Available as: 
  
  • 12.7mm diameter with 4mm and 6mm extra height and 25.4mm diameter with 4mm extra height

• Low profile 12.7 pin stubs to enable very short working distances for high resolution SEM imaging and FIB operations. Horizontal (flat), 90° pre-tilt, 38° pre-tilt (for FEI systems) and 35° pre-tilt (Tescan systems)

• Engraved pin stubs with lines and numbers for mounting multiple samples or for relocating a sample. Stub diameters are 12.7, 19, 25.4 and 32mm.

• Swivel pin mount with a top diameter of 15mm which can be tilted 90º both ways.

• Dish cylinder stub with 12.7mm stub diameter for sample preparation of solutions or fluids directly on the stub. The dish design prevent fluid from dripping of the stub. Sample can be dried on the SEM stub.

• Cambridge S4 stub, which is not a pin stub but used on many SEMs with pin stubs.  A Cambridge S4 holder orCambridge S4 adapter is needed for the Cambridge S4 stub.

• SEM pin stub extenders to quickly adjust height and bring samples closer to the polepiece.

→ If you need an SEM sample pin stub which is not offered in the list below, please contact us. We can manufacture custom sample stubs or suggest a solution with other sample stubs.